Vertical Laue Crystal Orientation System
Technical record / 0003
The Vertical Laue Crystal Orientation System provides the most flexible configuration for high-throughput single crystal orientation analysis. Using a vertical beam path, samples are held by gravity without needing to be adhered to the platform, enabling easier mounting.
The system features a CCD back-reflection X-ray detector with large active area (155 × 105 mm) and high resolution (2500 × 1650 pixels), combined with a sealed tungsten X-ray tube source (5–50 keV). The collimated beam can be focused down to 200 µm.
Dedicated Laue software provides real-time pattern display, automatic spot detection and indexing, misorientation calculation, and stereographic projection.
What Sets This Product Apart
Technical Details
- 01Accuracy: Down to 0.1°
- 02Detector: CCD back-reflection, 155 × 105 mm active area
- 03Detector Resolution: 2500 × 1650 pixels (60 µm pixel size)
- 04Beam Size: 450 µm standard, 200 µm fine focus
- 05Energy Range: 5 – 50 keV
- 06X-ray Source: Sealed tube, tungsten target, up to 50W
- 07Exposure Time: 1 – 30 seconds typical
- 08Configurations: Vertical, Horizontal, Grain Map
- 09Stages: Motorized XYZ with automated goniometer options
- 10Sample Size: From <200 µm crystals to large components (up to 860 mm)
Where It Excels
- 01Single crystal orientation for research and industry
- 02Crystal cutting and preparation alignment
- 03Wafer inspection and quality control
- 04Nickel-based superalloy turbine blade analysis
- 05Non-linear optics and piezoelectric material characterization
- 06Scintillation crystal orientation for medical imaging
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