Resolve What Others Cannot See
From single-photon detection and EUV reflection to crystal orientation and nanofocusing, Opticore turns frontier optics into deployable systems.
Control Reflection at 13.5 Nanometers
Extreme ultraviolet multilayer optics
Precision multilayer coatings turn an otherwise absorbed wavelength into a usable optical path for lithography, metrology, and advanced research.
Inspect EUV optics ↗From Frontier Physics to Working Systems
Detect Individual Quanta
Shape Extreme Wavelengths
Measure Crystal Orientation
Configure for the Application
“Make the Invisible Measurable”
Four Platforms. One Measurement Mission
Single Photon Counting Pixel Detectors
The cameras are for material analysis, non-destructive testing, color radiography, or radiation safety. It senses every single particle of radiation of almost any kind, including X-rays, gamma, electrons, ions, and even neutrons. Based on CERN technology, our cameras revolutionize a range of industries, from space to medicine.
13.5nm EUV Multilayer Mirror
This precision optical component is designed for EUV applications, specifically optimized for 13.5nm wavelength. Featuring a multilayer coating of alternating high- and low-refractive index materials, it enhances EUV light reflection. Ideal for EUV lithography and advanced scientific instruments, this mirror exemplifies cutting-edge EUV optics.
Vertical Laue Crystal Orientation System
A high-resolution Crystal Orientation System is the ideal tool to capture and analyse Laue diffraction patterns from a wide range of crystalline materials. This Laue orientation tool combines a high-resolution CCD X-ray detector, high-brilliance X-ray beam and dedicated Laue software, delivering indexed Laue diffraction measurements to 0.1° accuracy in seconds.
Highest Efficiency Fresnel Zone Plates
High efficiency due to material choice (Au, Ni, Si, SiO₂, Ir, Cr, Diamond). Optimized phase shift and low absorption. Blazed optics overcome limitations of binary optics, delivering the highest possible diffraction efficiency for X-ray microscopy and synchrotron applications.
MiniPIX MAGIC — Miniaturized Photon-Counting Camera
A miniaturized and low-power radiation camera equipped with the Timepix3 sensor (256x256 pixels, 55um pitch). It digitally registers position, energy, time of arrival, and track shape of every single particle. Ideal for non-destructive testing, material analysis, biomedical imaging, and space radiation monitoring.
WidePIX CHROMATIC - Multi-Chip Spectral X-Ray Imager
A large-area, multi-chip X-ray imaging detector based on Medipix3 photon-counting chips. Capable of spectral material-sensitive color radiography with up to 170 fps. Hardware-based Time-Delayed Integration for conveyor-belt scanning and CT.
EUV Multilayer Mirrors - 13.5 nm
Precision Mo/Si multilayer mirrors for EUV applications. Standard mirrors deliver >65% reflectance at 13.5 nm with >500 pm FWHM bandwidth. Custom geometries up to 650 mm diameter with form error down to lambda/50.
Soft X-Ray and XUV Multilayer Mirrors
Custom multilayer mirrors covering soft X-ray (1-13.5 nm) and XUV (13.5-100 nm) ranges. Designed for water window microscopy, synchrotron beamlines, and EUV solar missions.
Achromatic X-Ray Lenses
Achromatic X-ray lenses combining diffractive and refractive elements for high-resolution imaging across a wide energy range. Manufactured by 3D nanoprinting in ISO 4 cleanroom.
Diamond X-Ray Optics
Single-crystal diamond optical components for high-intensity synchrotron and XFEL sources. Thermal conductivity >2000 W/mK with low X-ray absorption for windows, beam splitters, and monochromators.
Intensified CMOS Camera
Intensified CMOS camera with 18 mm image intensifier coupled to a high-sensitivity sCMOS sensor. Gating down to 3 ns enables time-resolved imaging of ultra-fast phenomena.
Scientific sCMOS Cameras
High-performance sCMOS cameras with selected sub-electron read noise for quantitative fluorescence microscopy, spectroscopy, and scientific imaging. Open software platform.