Four complementary platforms address detection, reflection, orientation, and focusing across EUV, X-ray, and particle-imaging workflows.
15 of 15 products
Other systems
hiXAS offers a complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES) measurements. In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid detector together with a software suite to control instrument functions and analyze data.
Photon detection
The cameras are for material analysis, non-destructive testing, color radiography, or radiation safety. It senses every single particle of radiation of almost any kind, including X-rays, gamma, electrons, ions, and even neutrons. Based on CERN technology, our cameras revolutionize a range of industries, from space to medicine.
EUV optics
This precision optical component is designed for EUV applications, specifically optimized for 13.5nm wavelength. Featuring a multilayer coating of alternating high- and low-refractive index materials, it enhances EUV light reflection. Ideal for EUV lithography and advanced scientific instruments, this mirror exemplifies cutting-edge EUV optics.
Crystal analysis
A high-resolution Crystal Orientation System is the ideal tool to capture and analyse Laue diffraction patterns from a wide range of crystalline materials. This Laue orientation tool combines a high-resolution CCD X-ray detector, high-brilliance X-ray beam and dedicated Laue software, delivering indexed Laue diffraction measurements to 0.1° accuracy in seconds.
X-ray optics
High efficiency due to material choice (Au, Ni, Si, SiO₂, Ir, Cr, Diamond). Optimized phase shift and low absorption. Blazed optics overcome limitations of binary optics, delivering the highest possible diffraction efficiency for X-ray microscopy and synchrotron applications.
X-ray imaging
Very high-resolution X-ray imaging detector with 64 megapixel resolution, large square active area, and fast dynamic imaging. A custom scintillator is deposited onto the sensor to enable detection from 1 keV up to 100 keV. Four 16 MP sCMOS sensors are fibre-optically coupled to form a seamless large-area imager.
X-ray imaging
A high-resolution X-ray digital detector using state-of-the-art sCMOS technology with ultra-low read noise. With a custom scintillator covering 1 keV to 300 keV, this detector is suited for high-energy radiography, industrial CT, and laboratory X-ray diffraction imaging.
Crystal analysis
A compact, plug-and-play cabinet system for real-time single-crystal orientation. The Laue-XT features a high-resolution CCD back-reflection detector (155 × 105 mm active area), sealed tungsten-target X-ray source, and dedicated Laue software for automated indexing with 0.1° accuracy. Supports samples up to 450 × 250 × 250 mm.
Infrared imaging
A high-sensitivity short-wave infrared (SWIR) camera using a selected InGaAs sensor with VGA resolution (640 × 512). TE cooling reduces dark current for long-exposure imaging. Designed for scientific and industrial applications including semiconductor inspection, solar cell evaluation, and spectroscopy.
X-ray optics
XRNanotech offers the widest selection of Fresnel zone plates with world-record 7 nm outermost zone width via the Ir-line-doubling technique. Materials include Au, Ni, Ir, Pt, Si, Diamond and more. Optimised for 50 eV to 20 keV with blazed, multi-step, and binary profiles. Fabricated by e-beam lithography, photolithography, and X-ray LIGA.
X-ray optics
Precision diffraction gratings and beam splitters fabricated via e-beam lithography with user-selectable pitch, height, and orientation. Materials include silicon, diamond, gold, iridium, and more. Available as linear, blazed, or custom patterns on silicon wafers or transparent membranes. Designed for beam splitting, magneto-optical traps, EUV optics, and synchrotron monochromators.
Photon detection
The MiniPIX is a compact, USB-powered pixel detector based on the CERN Timepix3 chip. It counts individual X-ray, gamma, electron, and ion particles with per-pixel energy resolution and 10 ns time resolution. Available in multiple configurations including the SPRINTER (fast readout), SPACE (radiation-hard), and EDU (educational).
Photon detection
The AdvaPIX Quad combines four Timepix3 chips in a 2×2 array for large-area single-photon-counting imaging at up to 6.5 MP equivalent resolution. Available in Si, CdTe, or GaAs sensor materials, the AdvaPIX is designed for high-throughput X-ray imaging, electron microscopy, and energy-resolved radiography.
Photon detection
The WidePIX CHROMATIC is ADVACAM's largest pixel detector, scaling Timepix technology to up to 14 megapixels for full-field energy-sensitive X-ray imaging. Designed for industrial NDT, medical imaging research, and synchrotron applications, the CHROMATIC series provides colour X-ray imaging via per-pixel energy discrimination.
EUV optics
OptiXfab fabricates precision multilayer mirrors for the EUV (13.5 nm), soft X-ray (1–13.5 nm), and XUV (13.5–100 nm) spectral regions. Standard mirrors achieve R > 65% at 13.5 nm with λ/20 form error. Custom optics are available up to 650 mm diameter with λ/50 precision, in spherical, cylindrical, toroidal, elliptical, and parabolic figures.
