Technology Platforms

Choose the Right Optical Path

Overview channel

Four complementary platforms address detection, reflection, orientation, and focusing across EUV, X-ray, and particle-imaging workflows.

Start from the measurement objective. We will help connect wavelength, sample, geometry, and performance requirements to a practical system.

Discuss a Requirement

System availableCH-01

Single Photon Counting Pixel Detectors

Direct Conversion — CERN Medipix Technology

The cameras are for material analysis, non-destructive testing, color radiography, or radiation safety. It senses every single particle of radiation of almost any kind, including X-rays, gamma, electrons, ions, and even neutrons. Based on CERN technology, our cameras revolutionize a range of industries, from space to medicine.

Key Specs

Pixel Size: 55µm × 55µm (Medipix2/3), 75µm × 75µm (Medipix4)
Pixel Matrix: 256 × 256 (Medipix2/3), 512 × 448 (Medipix4)
Sensitive Area: 1.4 × 1.4 cm (single chip), up to 6.93 cm² (Medipix4)
Energy Range: From 3 keV upwards

Applications

Medical X-ray and gamma-ray imaging
Non-destructive testing and material analysis
Color radiography and spectral imaging

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System availableCH-02

13.5nm EUV Multilayer Mirror

Precision Mo/Si Multilayer Coating for Extreme Ultraviolet

This precision optical component is designed for EUV applications, specifically optimized for 13.5nm wavelength. Featuring a multilayer coating of alternating high- and low-refractive index materials, it enhances EUV light reflection. Ideal for EUV lithography and advanced scientific instruments, this mirror exemplifies cutting-edge EUV optics.

Key Specs

Peak Wavelength: 13.50 nm / 13.52 nm
Peak Reflectivity: >69% at near-normal incidence
Coating: Mo/Si multilayer, 40–70 bilayers
d-spacing Precision: ±0.005 nm RMS

Applications

EUV lithography illumination and projection optics
EUV metrology and mask inspection
Coherent diffractive imaging (CDI)

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System availableCH-03

Vertical Laue Crystal Orientation System

High-Resolution Laue Diffraction for Single Crystal Analysis

A high-resolution Crystal Orientation System is the ideal tool to capture and analyse Laue diffraction patterns from a wide range of crystalline materials. This Laue orientation tool combines a high-resolution CCD X-ray detector, high-brilliance X-ray beam and dedicated Laue software, delivering indexed Laue diffraction measurements to 0.1° accuracy in seconds.

Key Specs

Accuracy: Down to 0.1°
Detector: CCD back-reflection, 155 × 105 mm active area
Detector Resolution: 2500 × 1650 pixels (60 µm pixel size)
Beam Size: 450 µm standard, 200 µm fine focus

Applications

Single crystal orientation for research and industry
Crystal cutting and preparation alignment
Wafer inspection and quality control

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Vertical Laue Crystal Orientation System

System availableCH-04

Highest Efficiency Fresnel Zone Plates

Advanced Diffractive Optics for X-Ray Focusing

High efficiency due to material choice (Au, Ni, Si, SiO₂, Ir, Cr, Diamond). Optimized phase shift and low absorption. Blazed optics overcome limitations of binary optics, delivering the highest possible diffraction efficiency for X-ray microscopy and synchrotron applications.

Key Specs

Outermost Zone Width: Down to 7 nm (line-doubled Ir), 15–50 nm (standard)
Zone Plate Diameter: 0.05 – 10 mm (custom larger available)
Aspect Ratio: Up to 20:1 (HSQ template + ALD coating)
Materials: Au, Ni, Ir, Pt, Cr, Ru, Si, SiO₂, Diamond

Applications

Scanning transmission X-ray microscopy (STXM)
Full-field transmission X-ray microscopy (TXM)
Synchrotron beamline nanofocusing

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System availableCH-05

MiniPIX MAGIC — Miniaturized Photon-Counting Camera

Timepix3 — Position, Energy, and Time-Sensitive Detection

A miniaturized and low-power radiation camera equipped with the Timepix3 sensor (256x256 pixels, 55um pitch). It digitally registers position, energy, time of arrival, and track shape of every single particle. Ideal for non-destructive testing, material analysis, biomedical imaging, and space radiation monitoring.

Key Specs

Sensor: Timepix3, 256x256 pixels, 55um pitch
Sensitive Area: 14x14 mm
Energy Resolution: 1.2-9.9 keV FWHM
Time Resolution: 1.6 ns

Applications

Non-destructive testing and material analysis
X-ray and gamma-ray imaging
Particle tracking and radiation monitoring

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MiniPIX MAGIC — Miniaturized Photon-Counting Camera

System availableCH-06

WidePIX CHROMATIC - Multi-Chip Spectral X-Ray Imager

Medipix3 - Color Radiography with Charge Summing Mode

A large-area, multi-chip X-ray imaging detector based on Medipix3 photon-counting chips. Capable of spectral material-sensitive color radiography with up to 170 fps. Hardware-based Time-Delayed Integration for conveyor-belt scanning and CT.

Key Specs

Sensor: Medipix3 (tiled array)
Pixel Pitch: 55um
Resolution: 9 lp/mm
Frame Rate: up to 170 fps

Applications

Industrial CT scanning and NDT
Material-sensitive color radiography
Conveyor-belt inspection and security scanning

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WidePIX CHROMATIC - Multi-Chip Spectral X-Ray Imager

System availableCH-07

EUV Multilayer Mirrors - 13.5 nm

Mo/Si Coatings - Reflectance >65% at 13.5 nm

Precision Mo/Si multilayer mirrors for EUV applications. Standard mirrors deliver >65% reflectance at 13.5 nm with >500 pm FWHM bandwidth. Custom geometries up to 650 mm diameter with form error down to lambda/50.

Key Specs

Reflectance: >65% @ 13.5 nm (6 deg AOI)
Bandwidth: >500 pm FWHM
Standard Size: 1 inch x 6.35 mm
Figure Error: lambda/20 standard, lambda/50 custom

Applications

EUV lithography
EUV metrology and inspection
Synchrotron and FEL beamlines

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System availableCH-08

Soft X-Ray and XUV Multilayer Mirrors

Custom Coatings for 1-100 nm Wavelength Range

Custom multilayer mirrors covering soft X-ray (1-13.5 nm) and XUV (13.5-100 nm) ranges. Designed for water window microscopy, synchrotron beamlines, and EUV solar missions.

Key Specs

Range: 1 nm - 100 nm (10 eV - 1 keV)
Custom: Reflectance, AOI, bandwidth per application
Geometries: Flat, spherical, cylindrical up to 650 mm
Figure Error: Up to lambda/50

Applications

Water window microscopy (2.3-4.4 nm)
Synchrotron and XFEL optics
EUV solar missions

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System availableCH-09

Achromatic X-Ray Lenses

Diffractive-Refractive Hybrid for Broadband Focusing

Achromatic X-ray lenses combining diffractive and refractive elements for high-resolution imaging across a wide energy range. Manufactured by 3D nanoprinting in ISO 4 cleanroom.

Key Specs

Type: Diffractive-refractive hybrid
Fabrication: 3D nanoprinting (two-photon polymerization)
Cleanroom: ISO 4 (2000 sqm facility)
Resolution: High across broad energy band

Applications

Synchrotron X-ray microscopy
X-ray fluorescence mapping
STXM and full-field microscopy

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System availableCH-10

Diamond X-Ray Optics

High Heat Load Windows and Beamline Components

Single-crystal diamond optical components for high-intensity synchrotron and XFEL sources. Thermal conductivity >2000 W/mK with low X-ray absorption for windows, beam splitters, and monochromators.

Key Specs

Material: Single-crystal CVD diamond
Thermal Conductivity: >2000 W/mK
Applications: Windows, beam splitters, monochromators
Fabrication: In-house micro/nano fabrication

Applications

Synchrotron beamlines
XFEL optics
High-power X-ray source windows

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System availableCH-11

Intensified CMOS Camera

3 ns Optical Gating with Single-Photon Sensitivity

Intensified CMOS camera with 18 mm image intensifier coupled to a high-sensitivity sCMOS sensor. Gating down to 3 ns enables time-resolved imaging of ultra-fast phenomena.

Key Specs

Gating: Down to 3 ns
Intensifier: 18 mm format
Sensor: High-sensitivity sCMOS
Spectral Range: UV to NIR

Applications

Plasma diagnostics
Time-resolved fluorescence
Ballistic imaging

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System availableCH-12

Scientific sCMOS Cameras

Sub-Electron Read Noise for Quantitative Imaging

High-performance sCMOS cameras with selected sub-electron read noise for quantitative fluorescence microscopy, spectroscopy, and scientific imaging. Open software platform.

Key Specs

Read Noise: Sub-electron (selected sensors)
Options: Monochrome or colour
Cooling: Thermoelectric
Software: Open platform

Applications

Quantitative fluorescence microscopy
Spectroscopy and hyperspectral imaging
Single-molecule detection

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For detailed specifications and pricing, please contact our team.