Crystal analysis
Vertical Laue Crystal Orientation System
High-Resolution Laue Diffraction for Single Crystal Analysis
- Accuracy
- Down to 0.1°
- Detector
- CCD back-reflection, 155 × 105 mm active area
- Detector Resolution
- 2500 × 1650 pixels (60 µm pixel size)
Overview
Technical record / 0017
The Vertical Laue Crystal Orientation System provides the most flexible configuration for high-throughput single crystal orientation analysis. Using a vertical beam path, samples are held by gravity without needing to be adhered to the platform, enabling easier mounting.
The system features a CCD back-reflection X-ray detector with large active area (155 × 105 mm) and high resolution (2500 × 1650 pixels), combined with a sealed tungsten X-ray tube source (5–50 keV). The collimated beam can be focused down to 200 µm.
Dedicated Laue software provides real-time pattern display, automatic spot detection and indexing, misorientation calculation, and stereographic projection.
What Sets This Product Apart
Technical Details
- Accuracy
- Down to 0.1°
- Detector
- CCD back-reflection, 155 × 105 mm active area
- Detector Resolution
- 2500 × 1650 pixels (60 µm pixel size)
- Beam Size
- 450 µm standard, 200 µm fine focus
- Energy Range
- 5 – 50 keV
- X-ray Source
- Sealed tube, tungsten target, up to 50W
- Exposure Time
- 1 – 30 seconds typical
- Configurations
- Vertical, Horizontal, Grain Map
- Stages
- Motorized XYZ with automated goniometer options
- Sample Size
- From <200 µm crystals to large components (up to 860 mm)
Where It Excels
- 01Single crystal orientation for research and industry
- 02Crystal cutting and preparation alignment
- 03Wafer inspection and quality control
- 04Nickel-based superalloy turbine blade analysis
- 05Non-linear optics and piezoelectric material characterization
- 06Scintillation crystal orientation for medical imaging
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