hiXAS

• lab-based turn-key EXAFS and XANES system

• synchrotron-quality spectra

• very high signal to noise ratio

• wide bandpass of up to 1keV

hiXAS offers a complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES) measurements. In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid detector together with a software suite to control instrument functions and analyze data.

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Spectra quality is on par with synchrotron measurements, so that tedious applying and waiting for beamtime is no longer necessary.

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The x-ray tube source and spectrometer cover the energy range 4 to 30 keV, thus including the K absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the spectrometer yields an extremely high signal-to-noise ratio. As a consequence, the analyte concentration can be as low as a few weight percent. The instrument combines high efficiency with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered absorption edges.

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Customized versions of hiXAS are available.