Crystal analysis
Laue Crystal Orientation System — Laue-XT
Photonic Science — 0.1° Accuracy, Vertical & Horizontal Configurations
- Accuracy
- down to 0.1°
- Detector
- CCD back-reflection, 155 × 105 mm active area, 2570 × 1710 pixels
- X-ray source
- sealed tungsten target, 5–29 keV
Overview
Technical record / 0021
The Laue Crystal Orientation System from Photonic Science provides accurate, repeatable crystal orientation in seconds. Available in vertical, horizontal, and grain-map configurations, it serves applications ranging from turbine blade inspection to research crystal alignment.
The Laue-XT model accommodates the largest samples — up to 450 × 250 × 250 mm — while maintaining 0.1° orientation accuracy. A high-resolution CCD detector captures Laue diffraction patterns that are automatically indexed by the dedicated software. The system is air-cooled and requires no water chiller, making it a true plug-and-play solution for both laboratory and production environments.
What Sets This Product Apart
Technical Details
- Accuracy
- down to 0.1°
- Detector
- CCD back-reflection, 155 × 105 mm active area, 2570 × 1710 pixels
- X-ray source
- sealed tungsten target, 5–29 keV
- Beam size
- 450 µm standard (250 µm fine focus)
- Exposure time
- 1–30 seconds typical
- Max sample
- 450 × 250 × 250 mm (Laue-XT)
- Configurations
- Vertical, Horizontal, Grain Map
- Additional detail
- Air-cooled — no water chiller required
- Additional detail
- Dedicated Laue software with automated indexing and CSV export
Where It Excels
- 01Single crystal orientation for research and production
- 02Turbine blade (superalloy) inspection
- 03Crystal cutting and polishing alignment
- 04Wafer and substrate quality control
- 05Scintillation crystal characterization
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