Technology Platforms

Choose the Right Optical Path

Four complementary platforms address detection, reflection, orientation, and focusing across EUV, X-ray, and particle-imaging workflows.

Selection guidance
Start from the measurement objective. We will help connect wavelength, sample, geometry, and performance requirements to a practical system.

8 of 15 products

Single Photon Counting Pixel Detectors

Photon detection

Single Photon Counting Pixel Detectors

The cameras are for material analysis, non-destructive testing, color radiography, or radiation safety. It senses every single particle of radiation of almost any kind, including X-rays, gamma, electrons, ions, and even neutrons. Based on CERN technology, our cameras revolutionize a range of industries, from space to medicine.

Pixel Size
55µm × 55µm (Medipix2/3), 75µm × 75µm (Medipix4)
Pixel Matrix
256 × 256 (Medipix2/3), 512 × 448 (Medipix4)
Vertical Laue Crystal Orientation System

Crystal analysis

Vertical Laue Crystal Orientation System

A high-resolution Crystal Orientation System is the ideal tool to capture and analyse Laue diffraction patterns from a wide range of crystalline materials. This Laue orientation tool combines a high-resolution CCD X-ray detector, high-brilliance X-ray beam and dedicated Laue software, delivering indexed Laue diffraction measurements to 0.1° accuracy in seconds.

Accuracy
Down to 0.1°
Detector
CCD back-reflection, 155 × 105 mm active area
Laue Crystal Orientation System — Laue-XT

Crystal analysis

Laue Crystal Orientation System — Laue-XT

A compact, plug-and-play cabinet system for real-time single-crystal orientation. The Laue-XT features a high-resolution CCD back-reflection detector (155 × 105 mm active area), sealed tungsten-target X-ray source, and dedicated Laue software for automated indexing with 0.1° accuracy. Supports samples up to 450 × 250 × 250 mm.

Accuracy
down to 0.1°
Detector
CCD back-reflection, 155 × 105 mm active area, 2570 × 1710 pixels
Products | Opticore