Technology Platforms

Choose the Right Optical Path

Four complementary platforms address detection, reflection, orientation, and focusing across EUV, X-ray, and particle-imaging workflows.

Selection guidance
Start from the measurement objective. We will help connect wavelength, sample, geometry, and performance requirements to a practical system.

7 of 15 products

High-Aspect-Ratio Fresnel Zone Plates

X-ray optics

High-Aspect-Ratio Fresnel Zone Plates

XRNanotech offers the widest selection of Fresnel zone plates with world-record 7 nm outermost zone width via the Ir-line-doubling technique. Materials include Au, Ni, Ir, Pt, Si, Diamond and more. Optimised for 50 eV to 20 keV with blazed, multi-step, and binary profiles. Fabricated by e-beam lithography, photolithography, and X-ray LIGA.

Outermost zone width
down to 7 nm (Ir-line-doubling), >10 nm (soft X-ray), >25 nm (hard X-ray)
Height
>120 nm (soft X-ray), >700 nm (hard X-ray), 50 nm (EUV)
X-ray Gratings & Beam Splitters

X-ray optics

X-ray Gratings & Beam Splitters

Precision diffraction gratings and beam splitters fabricated via e-beam lithography with user-selectable pitch, height, and orientation. Materials include silicon, diamond, gold, iridium, and more. Available as linear, blazed, or custom patterns on silicon wafers or transparent membranes. Designed for beam splitting, magneto-optical traps, EUV optics, and synchrotron monochromators.

Patterns
Linear, blazed, custom shapes
Fabrication
e-beam lithography with greyscale capability
Custom EUV Multilayer Mirrors (13.5 nm)

EUV optics

Custom EUV Multilayer Mirrors (13.5 nm)

OptiXfab fabricates precision multilayer mirrors for the EUV (13.5 nm), soft X-ray (1–13.5 nm), and XUV (13.5–100 nm) spectral regions. Standard mirrors achieve R > 65% at 13.5 nm with λ/20 form error. Custom optics are available up to 650 mm diameter with λ/50 precision, in spherical, cylindrical, toroidal, elliptical, and parabolic figures.

Peak wavelength
13.5 nm (EUV), 1–13.5 nm (soft X-ray), 13.5–100 nm (XUV)
Reflectivity
R > 65% @ 13.5 nm (standard)
Products | Opticore